D. Bachman, Z. Chen, C. Wang, R. Fedosejevs, Y. Y. Tsui and V. Van, “Postfabrication Phase Error Correction of Silicon Photonic Circuits by Single Femtosecond Laser Pulses,” in Journal of Lightwave Technology, vol. 35, no. 4, pp. 588-595, 15 Feb.15, 2017 (web)

D. Bachman, Z. Chen, R. Fedosejevs, Y. Tsui and V. Van, “Very fine refractive index tuning of silicon by single femtosecond laser pulses below melting threshold,” 2017 Conference on Lasers and Electro-Optics (CLEO), San Jose, CA, 2017 (web)

Daniel Bachman, Zhijiang Chen, Christopher Wang, Robert Fedosejevs, Ying Y. Tsui, and Vien Van, “Postfabrication Phase Error Correction of Silicon Photonic Circuits by Single Femtosecond Laser Pulses,” J. Lightwave Technol. 35, 588-595 (2017) (web)

D. Bachman, Z. Chen, Y. Y. Tsui, R. Fedosejevs and V. Van, “Post-fabrication trimming of silicon photonic circuits by femtosecond laser pulses,” 2016 Optical Fiber Communications Conference and Exhibition (OFC), Anaheim, CA, 2016 (web)

D. Bachman, Z. Chen, J. N. Westwood-Bachman, W. K. Hiebert, Y. Painchaud, M. Poulin, R. Fedosejevs Y. Y. Tsui, and V. Van. “Permanent Phase Correction in a Polarization Diversity Si PIC by Femtosecond Laser Pulses” IEEE Photonics Technology Letters, Vol. 27, no.17, pp. 1880-1883 (2015) (web)

D. Bachman, Z. Chen, J.N. Westwood, W.K. Hiebert, Y. Painchaud, M. Poulin, R. Fedosejevs, Y. Y. Tsui, and V. Van, “Permanent, Post-fabrication Trimming of Polarization Diversity Silicon Circuits by Single fs Laser Pulses.” FiO/LS, Tucson, USA Oct 20-24, 2014 (Oral session, paper FM3A.5) (web)