Postfabrication Phase Error Correction of Silicon Photonic Circuits by Single Femtosecond Laser Pulses

Submitted by tzimmerl on Tue, 10/08/2019 - 19:54

D. Bachman, Z. Chen, C. Wang, R. Fedosejevs, Y. Y. Tsui and V. Van, “Postfabrication Phase Error Correction of Silicon Photonic Circuits by Single Femtosecond Laser Pulses,” in Journal of Lightwave Technology, vol. 35, no. 4, pp. 588-595, 15 Feb.15, 2017 (web)

Very fine refractive index tuning of silicon by single femtosecond laser pulses below melting threshold

Submitted by tzimmerl on Tue, 10/08/2019 - 19:51

D. Bachman, Z. Chen, R. Fedosejevs, Y. Tsui and V. Van, “Very fine refractive index tuning of silicon by single femtosecond laser pulses below melting threshold,” 2017 Conference on Lasers and Electro-Optics (CLEO), San Jose, CA, 2017 (web)

Postfabrication Phase Error Correction of Silicon Photonic Circuits by Single Femtosecond Laser Pulses

Submitted by tzimmerl on Tue, 10/08/2019 - 19:49

Daniel Bachman, Zhijiang Chen, Christopher Wang, Robert Fedosejevs, Ying Y. Tsui, and Vien Van, “Postfabrication Phase Error Correction of Silicon Photonic Circuits by Single Femtosecond Laser Pulses,” J. Lightwave Technol. 35, 588-595 (2017) (web)

Permanent, Post-fabrication Trimming of Polarization Diversity Silicon Circuits by Single fs Laser Pulses

Submitted by tzimmerl on Tue, 10/08/2019 - 19:36

D. Bachman, Z. Chen, J.N. Westwood, W.K. Hiebert, Y. Painchaud, M. Poulin, R. Fedosejevs, Y. Y. Tsui, and V. Van, “Permanent, Post-fabrication Trimming of Polarization Diversity Silicon Circuits by Single fs Laser Pulses.” FiO/LS, Tucson, USA Oct 20-24, 2014 (Oral session, paper FM3A.5) (web)