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D. Bachman, Z. Chen, J.N. Westwood, W.K. Hiebert, Y. Painchaud, M. Poulin, R. Fedosejevs, Y. Y. Tsui, and V. Van, “Permanent, Post-fabrication Trimming of Polarization Diversity Silicon Circuits by Single fs Laser Pulses.” FiO/LS, Tucson, USA Oct 20-24, 2014 (Oral session, paper FM3A.5) (web)